dc.contributor.author | Jigar, Abraham Almaw | |
dc.contributor.author | Liu, Yiliu | |
dc.contributor.author | Lundteigen, Mary Ann | |
dc.date.accessioned | 2016-08-12T07:16:19Z | |
dc.date.accessioned | 2016-08-25T12:43:23Z | |
dc.date.available | 2016-08-12T07:16:19Z | |
dc.date.available | 2016-08-25T12:43:23Z | |
dc.date.issued | 2016 | |
dc.identifier.citation | Reliability Engineering & System Safety 2016, 156:15-23 | nb_NO |
dc.identifier.issn | 0951-8320 | |
dc.identifier.uri | http://hdl.handle.net/11250/2401770 | |
dc.description.abstract | Safety-instrumented systems are used in industries to prevent the development of a process upset into an accident. For most processes, the desired response in the case of a process upset is to shutdown the process, and most safety-instrumented systems are designed so that this state is achieved in response to also specific item failures or loss of power. The side-effect of such fail-safe design may be that the safety-instrumented system is prone to spurious activation, meaning that the normal operation of the process may be interrupted in an untimely manner. In the design of a safety-instrumented system, it is therefore important to quantify the rate of spurious activation and to check the need for additional measures to ensure a stable as well as safe operation of the process. Unfortunately, weaknesses have been identified in formulas for spurious trip rate, and the aim of this paper is to present a further development of currently available analytical formulas. The paper builds the new formulas on a thorough discussion of the concepts of spurious activation, failure classification, and failure propagation in a safety-instrumented system. The proposed formulas are compared with existing ones for selected architectures, and some conclusions are drawn. | nb_NO |
dc.language.iso | eng | nb_NO |
dc.publisher | Elsevier | nb_NO |
dc.subject | Spurious activation; Spurious operation; Spurious trip rate (STR); Safety-instrumented system (SIS); Systematic failure; Common cause failure (CCF) | nb_NO |
dc.title | Spurious activation analysis of safety-instrumented systems | nb_NO |
dc.type | Journal article | nb_NO |
dc.date.updated | 2016-08-12T07:16:19Z | |
dc.description.version | submittedVersion | |
dc.source.pagenumber | 15-23 | nb_NO |
dc.source.volume | 156 | nb_NO |
dc.source.journal | Reliability Engineering & System Safety | nb_NO |
dc.identifier.doi | 10.1016/j.ress.2016.06.015 | |
dc.identifier.cristin | 1372282 | |