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dc.contributor.authorSchader, Florian H
dc.contributor.authorMorozov, Maxim
dc.contributor.authorTjønneland Wefring, Espen
dc.contributor.authorGrande, Tor
dc.contributor.authorWebber, Kyle G
dc.date.accessioned2016-01-04T20:46:20Z
dc.date.accessioned2016-03-09T14:48:42Z
dc.date.available2016-01-04T20:46:20Z
dc.date.available2016-03-09T14:48:42Z
dc.date.issued2015
dc.identifier.citationJournal of Applied Physics 2015, 117(19)nb_NO
dc.identifier.issn1089-7550
dc.identifier.urihttp://hdl.handle.net/11250/2381894
dc.description.abstractThe influence of uniaxial compressive stress on the small signal direct piezoelectric coefficient of hard and soft Pb(Zr,Ti)O3 at the morphotropic phase boundary was investigated as a function of temperature from 25 °C to 450 °C. The stress- and temperature-dependent piezoelectric data indicate that stress is capable of either directly or indirectly modifying the orientation of polar defects in the crystal lattice and reduce the internal bias field. At higher temperatures, the mobility of polar defects was found to increase, corresponding to a two-step decrease in the direct piezoelectric coefficient and a decrease in the frequency dispersion. Quenching experiments were used to elucidate the role of the internal bias field on the stress-dependent piezoelectric response.nb_NO
dc.language.isoengnb_NO
dc.publisherAmerican Institute of Physicsnb_NO
dc.titleMechanical stability of piezoelectric properties in ferroelectric perovskitesnb_NO
dc.typeJournal articlenb_NO
dc.typePeer revieweden_GB
dc.date.updated2016-01-04T20:46:20Z
dc.rights.holderCopyright (c) AIP Publishing. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing.nb_NO
dc.source.volume117nb_NO
dc.source.journalJournal of Applied Physicsnb_NO
dc.source.issue19nb_NO
dc.identifier.doi10.1063/1.4919815
dc.identifier.cristin1256230
dc.description.localcodeAuthor preprintnb_NO


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