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dc.contributor.authorRheenen, Arthur Dirk van
dc.contributor.authorHaakestad, Magnus Willum
dc.date.accessioned2015-05-05T08:55:08Z
dc.date.accessioned2015-12-10T12:28:08Z
dc.date.available2015-05-05T08:55:08Z
dc.date.available2015-12-10T12:28:08Z
dc.date.issued2015
dc.identifier.citationTerahertz Science and Technology, IEEE Transactions on 2015, 5(3):438-444nb_NO
dc.identifier.issn2156-342X
dc.identifier.urihttp://hdl.handle.net/11250/2367466
dc.description.abstractTerahertz images containing spectral information in each pixel are recorded in transmission mode using a fibercoupled time-domain spectroscopy system. The images are acquired by mounting a sample holder on an x–y stage, which is stepped across the beam in the two transverse directions, while the transmitted THz waveform is captured. The materials under investigation consist of uncovered and hidden samples of an explosive (RDX) and simulants (lactose and tartaric acid). Spectral angle mapping is used to identify the materials in the Terahertz images by comparing the spectrum in each pixel with a library of reference spectra for the different materials. We test the performance of several spectral characteristics derived from the measured transmission spectra. Robustness is studied by investigating the Receiver-Operating-Characteristics (ROCs). The ROCs are used to find which of the spectral characteristics is most robust to different sample preparation conditions, without the need for extensive pre-treatment of the data, such as baseline correction. Simple theoretical considerations are used to support the experimental results.nb_NO
dc.language.isoengnb_NO
dc.publisherIEEE, Institute of Electrical and Electronics Engineersnb_NO
dc.titleRobust Identification of Concealed Dangerous Substances by Spectral Correlation of Terahertz Transmission Imagesnb_NO
dc.typeJournal articlenb_NO
dc.typePeer revieweden_GB
dc.date.updated2015-05-05T08:55:08Z
dc.source.pagenumber438-444nb_NO
dc.source.volume5nb_NO
dc.source.journalIEEE Transactions on Terahertz Science & Technologynb_NO
dc.source.issue3nb_NO
dc.identifier.doi10.1109/TTHZ.2015.2400224
dc.identifier.cristin1240200
dc.description.localcodeThis is the authors accepted and refereed manuscript to the article. © 2015 IEEE.nb_NO


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