Browsing Institutt for materialteknologi by Journals "IEEE Journal of Photovoltaics"
Now showing items 1-2 of 2
-
Studying light-induced degradation by lifetime decay analysis: Excellent fit to solution of simple second-order rate equation
(Journal article; Peer reviewed, 2013)Twenty different boron-doped Czochralski silicon materials have been analyzed for light-induced degradation. The carrier lifetime degradation was monitored by an automated quasi-steady-state photoconductance setup with an ... -
Surface passivation properties of HfO2 thin film on n-Type crystalline Si
(Journal article, 2017)Atomic layer deposited hafnium oxide is shown to provide good surface passivation of low resistivity, n-type crystalline Si wafers after a low temperature anneal. The surface passivation is related to a fixed negative ...