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dc.contributor.authorBoisier, B.
dc.contributor.authorBilliot, B.
dc.contributor.authorAbdessalem, Z.
dc.contributor.authorGouton, Pierre
dc.contributor.authorHardeberg, Jon Yngve
dc.date.accessioned2011-04-18T06:29:09Z
dc.date.available2011-04-18T06:29:09Z
dc.date.issued2011
dc.identifier.citationBoisier, B., Billiot, B., Abdessalem, Z., Gouton, P. & Hardeberg, J. Y. (2011). Extraction and fusion of spectral parameters for face recognition. I: Proceedings of SPIE, the International Society for Optical Engineering, Image Processing: Machine Vision Applications IV, SPIE - International Society for Optical Engineering.en_US
dc.identifier.issn0277-786X
dc.identifier.urihttp://hdl.handle.net/11250/142522
dc.descriptionThis is the copy of journal's version originally published in Proc. SPIE 7877: http://spie.org/x10.xml?WT.svl=tn7. Reprinted with permission of SPIE.en_US
dc.description.abstractMany methods have been developed in image processing for face recognition, especially in recent years with the increase of biometric technologies. However, most of these techniques are used on grayscale images acquired in the visible range of the electromagnetic spectrum. The aims of our study are to improve existing tools and to develop new methods for face recognition. The techniques used take advantage of the different spectral ranges, the visible, optical infrared and thermal infrared, by either combining them or analyzing them separately in order to extract the most appropriate information for face recognition. We also verify the consistency of several keypoints extraction techniques in the Near Infrared (NIR) and in the Visible Spectrum.en_US
dc.language.isoengen_US
dc.publisherSociety of Photo Optical Instrumentation Engineers (SPIE)en_US
dc.relation.ispartofseriesProceedings of SPIE;7877
dc.titleExtraction and fusion of spectral parameters for face recognitionen_US
dc.typeJournal articleen_US
dc.typePeer revieweden_US
dc.description.versionpublishedVersion
dc.subject.nsiVDP::Mathematics and natural science: 400::Information and communication science: 420::Simulation, visualization, signal processing, image processing: 429en_US
dc.source.pagenumber6en_US
dc.identifier.doihttp://dx.doi.org/10.1117/12.876642en_US


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