Browsing NTNU Open by Author "Stengel, Massimiliano"

Now showing items 1-3 of 3

    • Electrostatic potential mapping at ferroelectric domain walls by low-temperature photoemission electron microscopy 

      Schaab, Jakob; Shapovalov, Konstantin; Schoenherr, Peggy; Hackl, Johanna; Khan, Muhammad Imtiaz; Hentschel, Mario; Yan, Zewu; Bourret, Edith; Schneider, Claus M.; Nemsak, Slavomír; Stengel, Massimiliano; Cano, Andrés; Meier, Dennis (Journal article; Peer reviewed, 2019)
      Low-temperature X-ray photoemission electron microscopy (X-PEEM) is used to measure the electric potential at domain walls in improper ferroelectric Er0.99Ca0.01MnO3. By combining X-PEEM with scanning probe microscopy and ...

    • Functional electronic inversion layers at ferroelectric domain walls 

      Mundy, Julia; Schaab, Jakob; Kumagai, Yu; Cano, Andres; Stengel, Massimiliano; Krug, Ingo P.; Gottlob, Daniel G.; Doganay, Hattice; Holtz, Megan, E.; Held, Rainer; Yan, Zewu; Bourret, Edith; Schneider, Claus M.; Schlom, Darrel G.; Muller, David A.; Ramesh, Ramamoorthy; Spaldin, Nicola A.; Meier, Dennis Gerhard (Journal article; Peer reviewed, 2017)
      Ferroelectric domain walls hold great promise as functional two-dimensional materials because of their unusual electronic properties. Particularly intriguing are the so-called charged walls where a polarity mismatch causes ...

    • Observation of uncompensated bound charges at improper ferroelectric domain walls 

      Schoenherr, Peggy; Shapovalov, Konstantin; Schaab, Jakob; Yan, Zewu; Bourret, Edith; Hentschel, Mario; Stengel, Massimiliano; Fiebig, Manfred; Cano, Andrés; Meier, Dennis (Journal article; Peer reviewed, 2019)
      Low-temperature electrostatic force microscopy (EFM) is used to probe unconventional domain walls in the improper ferroelectric semiconductor Er0.99Ca0.01MnO3 down to cryogenic temperatures. The low-temperature EFM maps ...