• Investigating thermal donors in n-type Cz silicon with carrier density imaging 

      Hu, Yu; Schøn, Hendrik; Øvrelid, Eivind Johannes; Nielsen, Øyvind; Arnberg, Lars (Journal article; Peer reviewed, 2012)
      A new method to map the thermal donor concentration in silicon wafers using carrier density imaging is presented. A map of the thermal donor concentration is extracted with high resolution from free carrier density images ...