• Atomap - Automated Analysis of Atomic Resolution STEM Images 

      Nord, Magnus Kristofer; Vullum, Per Erik; MacLaren, I; Tybell, Per Thomas Martin; Holmestad, Randi (Journal article, 2017)
      Atomic resolution scanning transmission electron microscopy (STEM) data contain a large amount of information about the structure of a crystalline material. Often, this information is hard to extract, due to the large ...
    • Atomap: a new software tool for the automated analysis of atomic resolution images using two-dimensional Gaussian fitting 

      Nord, Magnus Kristofer; Vullum, Per Erik; MacLaren, Ian; Tybell, Per Thomas Martin; Holmestad, Randi (Journal article; Peer reviewed, 2017)
      Scanning transmission electron microscopy (STEM) data with atomic resolution can contain a large amount of information about the structure of a crystalline material. Often, this information is hard to extract, due to the ...
    • Magnetic domain configuration of (111)-oriented LaFeO3 epitaxial thin films 

      Hallsteinsen, Ingrid; Moreau, Magnus; Chopdekar, R.V.; Christiansen, Emil; Nord, Magnus Kristofer; Vullum, Per Erik; Grepstad, Jostein; Holmestad, Randi; Selbach, Sverre Magnus; Scholl, A; Arenholz, E; Folven, Erik; Tybell, Per Thomas Martin (Journal article; Peer reviewed, 2017)
      In antiferromagnetic spintronics control of the domains and corresponding spin axis orientation is crucial for devices. Here we investigate the antiferromagnetic axis in (111)-oriented LaFeO3/SrTiO3, which is coupled to ...
    • Mapping the chemistry within, and the strain around, Al-alloy precipitates at atomic resolution by multi-frame scanning transmission electron microscopy 

      Jones, Lewys; Wenner, Sigurd; Nord, Magnus Kristofer; Ninive, Per Harald; Løvvik, Ole Martin; Marioara, Calin Daniel; Holmestad, Randi; Nellist, Peter (Journal article; Peer reviewed, 2017)
      Al-Mg-Si(-Cu)alloys, used primarily in the transportation sector, are strengthened by nano-sized precipitate particles. There is a plethora of possible phases, depending onwhich elements are added to the alloy ...
    • Methodology to Improve Strain Measurement in III–V Semiconductors Materials 

      Vatanparast, Maryam; Vullum, Per Erik; Nord, Magnus Kristofer; Reenaas, Turid Worren; Holmestad, Randi (Journal article; Peer reviewed, 2017)
      Geometric phase analysis (GPA), a fast and simple Fourier space method for strain analysis, can give useful information on accumulated strain and defect propagation in multiple layers of InAs/GaAs quantum dot (QD) materials. ...
    • On Vanadium Substitution in Li2MnSiO4/C as Positive Electrode for Li-ion Batteries 

      Wagner, Nils Peter; Vullum, Per Erik; Nord, Magnus Kristofer; Svensson, Ann Mari; Vullum-Bruer, Fride (Journal article; Peer reviewed, 2016)
      Vanadium substitution is an interesting approach to manipulate the properties of the poor electronic and ionic conducting lithium transition metal orthosilicates. Especially, if incorporated on the Si site, it could alter ...
    • Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping 

      Jones, Lewys; Wenner, Sigurd; Nord, Magnus Kristofer; Ninive, Per Harald; Løvvik, Ole Martin; Holmestad, Randi; Nellist, P.D. (Journal article; Peer reviewed, 2017)
      Annular dark-field scanning transmission electron microscopy is a powerful tool to study crystal defects at the atomic scale but historically single slow-scanned frames have been plagued by low-frequency scanning-distortions ...
    • Quantitative (S)TEM analysis of intermediate band solar cell materials 

      Nord, Magnus Kristofer (Master thesis, 2011)
      In this thesis the strain properties of two InAs/GaAs quantum dot intermediate band solar cell materials have been explored. Both samples were thin films grown on a (100) GaAs substrate. The quantum dot material was InAs, ...
    • Quantitative strain analysis of InAs/GaAs quantum dot materials 

      Vullum, Per Erik; Nord, Magnus Kristofer; Vatanparast, Maryam; Thomassen, Sedsel Fretheim; Boothroyd, Chris; Holmestad, Randi; Fimland, Bjørn-Ove; Reenaas, Turid Worren (Journal article; Peer reviewed, 2017)
      Geometric phase analysis has been applied to high resolution aberration corrected (scanning) transmission electron microscopy images of InAs/GaAs quantum dot (QD) materials. We show quantitatively how the lattice mismatch ...
    • Silicon-core glass fibres as microwire radial-junction solar cells 

      Martinsen, Fredrik A; Smeltzer, Benjamin; Nord, Magnus Kristofer; Hawkins, Thomas A.; Ballato, John; Gibson, Ursula (Journal article; Peer reviewed, 2014)
      Vertically aligned radial-junction solar cell designs offer potential improvements over planar geometries, as carrier generation occurs close to the junction for all absorption depths, but most production methods still ...
    • Strategy for reliable strain measurement in InAs/GaAs materials from high-resolution Z-contrast STEM images 

      Vatanparast, Maryam; Vullum, Per Erik; Nord, Magnus Kristofer; Zuo, Jian Min; Reenaas, Turid Worren; Holmestad, Randi (Journal article; Peer reviewed, 2017)
      Geometric phase analysis (GPA), a fast and simple Fourier space method for strain analysis, can give useful information on accumulated strain and defect propagation in multiple layers of semiconductors, including quantum ...
    • Structural investigation of epitaxial LaFeO3 thin films on (111) oriented SrTiO3 by transmission electron microscopy 

      Christiansen, Emil; Nord, Magnus Kristofer; Hallsteinsen, Ingrid; Vullum, Per Erik; Tybell, Per Thomas Martin; Holmestad, Randi (Journal article; Peer reviewed, 2015)
      We report on structural domains in LaFeO3 epitaxial thin films on (111) oriented SrTiO3 observed by transmission electron microscopy using low magnification dark field imaging and high resolution transmission electron ...