Browsing NTNU Open by Author "Mosberg, Aleksander Buseth"

Now showing items 1-9 of 9

    • Conductivity control via minimally invasive anti-Frenkel defects in a functional oxide 

      Evans, Donald; Holstad, Theodor Secanell; Mosberg, Aleksander Buseth; Småbråten, Didrik Rene; Vullum, Per Erik; Dadlani, Anup; Shapovalov, Konstantin; Yan, Zewu; Bourret, Edith; Gao, David Zhe; Akola, Jaakko; Torgersen, Jan; Van Helvoort, Antonius; Selbach, Sverre Magnus; Meier, Dennis (Peer reviewed; Journal article, 2020)
      Utilizing quantum effects in complex oxides, such as magnetism, multiferroicity and superconductivity, requires atomic-level control of the material’s structure and composition. In contrast, the continuous conductivity ...

    • Contact-free reversible switching of improper ferroelectric domains by electron and ion irradiation 

      Roede, Erik Dobloug; Mosberg, Aleksander Buseth; Evans, Donald; Bourret, Edith; Yan, Zewu; Van Helvoort, Antonius; Meier, Dennis (Peer reviewed; Journal article, 2021)
      Focused ion beam (FIB) and scanning electron microscopy (SEM) are used to reversibly switch improper ferroelectric domains in the hexagonal manganite ErMnO3. Surface charging is achieved by local ion (positive charging) ...

    • Examining the three-dimensional structure of an AlGaAs shell on GaAs nanowires 

      Mosberg, Aleksander Buseth (Master thesis, 2015)
      Semiconducting direct-bandgap nanowires (NWs) are a promising material system for future optoelectronic devices. In this work, the effect of shell growth temperature has been examined on the structural and optical properties ...

    • FIB lift-out of conducting ferroelectric domain walls in hexagonal manganites 

      Mosberg, Aleksander Buseth; Roede, Erik Dobloug; Evans, Donald; Holstad, Theodor S.; Bourret, Edith; Yan, Zewu; Van Helvoort, Antonius; Meier, Dennis (Journal article; Peer reviewed, 2019)
      A focused ion beam (FIB) methodology is developed to lift out suitable specimens containing charged domain walls in improper ferroelectric ErMnO3. The FIB procedure allows for extracting domain wall sections with well-defined ...

    • FIB lift-out of conducting ferroelectric domain walls in hexagonal manganites 

      Evans, Donald; Meier, Dennis; Mosberg, Aleksander Buseth; Roede, Erik Dobloug; Holstad, Theodor S.; Bourret, Edith; Yan, Zewu; Van Helvoort, Antonius (Journal article; Peer reviewed, 2019)
      A focused ion beam (FIB) methodology is developed to lift out suitable specimens containing charged domain walls in improper ferroelectric ErMnO3. The FIB procedure allows for extracting domain wall sections with well-defined ...

    • Lab-in-a-FIB 

      Mosberg, Aleksander Buseth (Doctoral theses at NTNU;2020:295, Doctoral thesis, 2020)
      The development of next-generation devices and technology requires micro- and nanoscale manipulation of complex functional material systems. The micro- to nanoscale experiments required to understand their function must ...

    • Observation of Electric-Field-Induced Structural Dislocations in a Ferroelectric Oxide 

      Evans, Donald; Småbråten, Didrik Rene; Holstad, Theodor Secanell; Vullum, Per Erik; Mosberg, Aleksander Buseth; Yan, Zewu; Bourret, Edith; Van Helvoort, Antonius; Selbach, Sverre Magnus; Meier, Dennis (Peer reviewed; Journal article, 2021)
      Dislocations are 1D topological defects with emergent electronic properties. Their low dimensionality and unique properties make them excellent candidates for innovative device concepts, ranging from dislocation-based ...

    • The Third Dimension of Ferroelectric Domain Walls 

      Roede, Erik Dobloug; Shapovalov, Konstantin; Moran, Thomas; Mosberg, Aleksander Buseth; Yan, Zewu; Bourret, Edith; Cano, Andres; Huey, Bryan D.; Van Helvoort, Antonius; Meier, Dennis (Peer reviewed; Journal article, 2022)
      Ferroelectric domain walls are quasi-2D systems that show great promise for the development of nonvolatile memory, memristor technology, and electronic components with ultrasmall feature size. Electric fields, for example, ...

    • Using FIB-SEM as a Platform for the Positioning and Correlated Characterization of III-V Nanowires 

      Mosberg, Aleksander Buseth; Ren, Dingding; Fauske, Vidar Tonaas; Fimland, Bjørn-Ove; Van Helvoort, Antonius (Journal article; Peer reviewed, 2018)