• IV and CV characterization of 90nm CMOS transistors 

      Lund, Håvard (Master thesis, 2006)
      A 90nm CMOS technology has been characterized on the basis of IV and CV measurements. This was feasible by means of a state of the art probe station and measurement instrumentation, capable of measuring current and capacitance ...
    • IV and CV characterization of 90nm CMOS transistors 

      Lund, Håvard (Master thesis, 2006)
      A 90nm CMOS technology has been characterized on the basis of IV and CV measurements. This was feasible by means of a state of the art probe station and measurement instrumentation, capable of measuring current and capacitance ...