• Analysis of PI-Control for Atomic Force Microscopy in Contact Mode 

      Messineo, Saverio; Ragazzon, Michael Remo Palmén; Busnelli, Fabio; Gravdahl, Jan Tommy (Peer reviewed; Journal article, 2021)
      This article investigates the properties, from a nonlinear control system standpoint, of atomic force microscope (AFM) systems, whenever operated in contact mode and controlled in the vertical direction by proportional-integral ...