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dc.contributor.authorSubhana, Arik
dc.contributor.authorStøa-Aanensen, Nina Sasaki
dc.contributor.authorGammelsæter, Marte
dc.contributor.authorMarskar, Robert
dc.contributor.authorMauseth, Frank
dc.date.accessioned2024-04-24T08:09:55Z
dc.date.available2024-04-24T08:09:55Z
dc.date.created2024-03-07T12:57:51Z
dc.date.issued2024
dc.identifier.issn1070-9878
dc.identifier.urihttps://hdl.handle.net/11250/3127857
dc.description.abstractThis paper reports on an observed phenomenon of increasing breakdown voltage while performing standard up and down lightning impulse (LI) testing in short air-gaps with weakly non-uniform field in an enclosed volume. The phenomenon could occur due to accumulation of space charges in the gap, changes in the chemical composition of the insulation gas, and/or changes in electrode surface due to discharges. To investigate the effect of these factors, LI tests are carried out in a 10 mm rod-plane air gap using four different methods: 1) ion flushing by DC voltage application in between LI shots, 2) with opposite polarity LI intertwined, 3) using forced air flow by a fan during the test, and 4) a reference test without any fan or voltage application. Results indicate that the phenomenon is more likely to be caused by formation of electronegative byproducts, e.g., ozone. Ozone was also experimentally detected near the test gap followed by consecutive LI breakdowns. It was found that air circulation rapidly reduces ozone concentration, which may explain why the increasing trend is not observed when a fan is used. Calculation of electron transport coefficients indicates that lack of primary electrons might be the prime reason of the increased impulse breakdown voltage of the air gap in presence of ozone.en_US
dc.description.abstractLightning Impulse Testing in Short Air-Gaps and Memory Effect of Previous Dischargesen_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleLightning Impulse Testing in Short Air-Gaps and Memory Effect of Previous Dischargesen_US
dc.title.alternativeLightning Impulse Testing in Short Air-Gaps and Memory Effect of Previous Dischargesen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionacceptedVersionen_US
dc.source.journalIEEE transactions on dielectrics and electrical insulationen_US
dc.identifier.doi10.1109/TDEI.2024.3374276
dc.identifier.cristin2252784
dc.relation.projectNorges forskningsråd: 319930en_US
cristin.ispublishedtrue
cristin.fulltextpreprint
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cristin.qualitycode1


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Navngivelse 4.0 Internasjonal
Except where otherwise noted, this item's license is described as Navngivelse 4.0 Internasjonal