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dc.contributor.authorRowenhorst, David J.
dc.contributor.authorCallahan, Patrick G.
dc.contributor.authorÅnes, Håkon W.
dc.date.accessioned2024-03-22T13:20:51Z
dc.date.available2024-03-22T13:20:51Z
dc.date.created2023-07-28T18:35:36Z
dc.date.issued2023
dc.identifier.citationMicroscopy and Microanalysis. 2023, 29 (1), 475-476.en_US
dc.identifier.issn1431-9276
dc.identifier.urihttps://hdl.handle.net/11250/3123880
dc.language.isoengen_US
dc.publisherOxford University Pressen_US
dc.titlePyEBSDIndex: Indexing Electron Backscattered Diffraction Patterns on the GPUen_US
dc.title.alternativePyEBSDIndex: Indexing Electron Backscattered Diffraction Patterns on the GPUen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.rights.holderThis version will not be available due to the publisher's copyright.en_US
dc.source.pagenumber475-476en_US
dc.source.volume29en_US
dc.source.journalMicroscopy and Microanalysisen_US
dc.source.issue1en_US
dc.identifier.doi10.1093/micmic/ozad067.224
dc.identifier.cristin2163897
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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