dc.contributor.author | Richarz, Leonie | |
dc.contributor.author | He, J. | |
dc.contributor.author | Ludacka, Ursula | |
dc.contributor.author | Bourret, E. | |
dc.contributor.author | Yan, Z. | |
dc.contributor.author | Van Helvoort, Antonius | |
dc.contributor.author | Meier, Dennis | |
dc.date.accessioned | 2024-03-08T12:31:37Z | |
dc.date.available | 2024-03-08T12:31:37Z | |
dc.date.created | 2023-05-26T10:27:18Z | |
dc.date.issued | 2023 | |
dc.identifier.citation | Applied Physics Letters. 2023, 122 (16), . | en_US |
dc.identifier.issn | 0003-6951 | |
dc.identifier.uri | https://hdl.handle.net/11250/3121581 | |
dc.description.abstract | Moiré physics plays an important role in characterization of functional materials and engineering of physical properties in general, ranging from strain-driven transport phenomena to superconductivity. Here, we report on the observation of moiré fringes in conductive atomic force microscopy (cAFM) scans gained on the model ferroelectric Er(Mn,Ti)O3. By performing a systematic study of the impact of key experimental parameters on the emergent moiré fringes, such as scan angle and pixel density, we demonstrate that the observed fringes arise due to a superposition of the applied raster scanning and sample-intrinsic properties, classifying the measured modulation in conductance as a scanning moiré effect. Our findings are important for the investigation of local transport phenomena in moiré engineered materials by cAFM, providing a general guideline for distinguishing extrinsic from intrinsic moiré effects. Furthermore, the experiments provide a possible pathway for enhancing the sensitivity, pushing the resolution limit of local transport measurements by probing conductance variations at the spatial resolution limit via more long-ranged moiré patterns. | en_US |
dc.language.iso | eng | en_US |
dc.publisher | AIP | en_US |
dc.rights | Navngivelse 4.0 Internasjonal | * |
dc.rights.uri | http://creativecommons.org/licenses/by/4.0/deed.no | * |
dc.title | Moiré fringes in conductive atomic force microscopy | en_US |
dc.title.alternative | Moiré fringes in conductive atomic force microscopy | en_US |
dc.type | Journal article | en_US |
dc.type | Peer reviewed | en_US |
dc.description.version | publishedVersion | en_US |
dc.source.volume | 122 | en_US |
dc.source.journal | Applied Physics Letters | en_US |
dc.source.issue | 16 | en_US |
dc.identifier.doi | 10.1063/5.0145173 | |
dc.identifier.cristin | 2149487 | |
cristin.ispublished | true | |
cristin.fulltext | original | |
cristin.qualitycode | 2 | |