Dielectric function and band gap determination of single crystal CuFeS2 using FTIR-VIS-UV spectroscopic ellipsometry

dc.contributor.author	Hale, Nathan
dc.contributor.author	Hartl, Matthias
dc.contributor.author	Humlíček, Josef
dc.contributor.author	Brüne, Christoph
dc.contributor.author	Kildemo, Morten
dc.date.accessioned	2023-11-02T08:03:03Z
dc.date.available	2023-11-02T08:03:03Z
dc.date.created	2023-06-22T15:19:41Z
dc.date.issued	2023
dc.identifier.citation	Optical Materials Express. 2023, 13 (7), 2020-2035.	en_US
dc.identifier.issn	2159-3930
dc.identifier.uri	https://hdl.handle.net/11250/3100172
dc.language.iso	eng	en_US
dc.title	Dielectric function and band gap determination of single crystal CuFeS2 using FTIR-VIS-UV spectroscopic ellipsometry	en_US
dc.title.alternative	Dielectric function and band gap determination of single crystal CuFeS2 using FTIR-VIS-UV spectroscopic ellipsometry	en_US
dc.type	Journal article	en_US
dc.type	Peer reviewed	en_US
dc.description.version	publishedVersion	en_US
dc.source.pagenumber	2020-2035	en_US
dc.source.volume	13	en_US
dc.source.journal	Optical Materials Express	en_US
dc.source.issue	7	en_US
dc.identifier.doi	10.1364/OME.493426
dc.identifier.cristin	2157231
cristin.ispublished	true
cristin.fulltext	original
cristin.qualitycode	1