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dc.contributor.authorAftab, Sofia
dc.contributor.authorRamampiaro, Heri
dc.date.accessioned2023-03-02T10:23:51Z
dc.date.available2023-03-02T10:23:51Z
dc.date.created2022-03-09T13:14:20Z
dc.date.issued2022
dc.identifier.citationIEEE Access. 2022, 10 30832-30845.en_US
dc.identifier.issn2169-3536
dc.identifier.urihttps://hdl.handle.net/11250/3055269
dc.description.abstractEvaluation metrics or measures are necessary tools for evaluating and choosing the most appropriate modeling approaches within recommender systems. However, evaluation measures can sometimes fall short when evaluating recommendation lists that best match users’ top preferences. A possible reason for this shortcoming is that most measures mainly focus on the list-wise performance of the recommendations and generally do not consider the item-wise performance. As a result, a recommender system might apply a weak or less accurate modeling approach instead of the best one. To address these challenges, we propose a new evaluation measure that incorporates the rank order of a prediction list with an error-based metric to make it more powerful and discriminative and thus more suited for top-N recommendations. The main goal of the proposed metric is to provide recommender systems, developers and researchers an even better tool, which enables them to choose the best modeling approach possible, and hence maximizing the quality of top-N recommendations. To evaluate the proposed metric and compare its general properties against existing metrics, we perform extensive experiments with detailed empirical analysis. Our experiments and the analysis show the usefulness, effectiveness and feasibility of the new metric.en_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleEvaluating Top-N Recommendations Using Ranked Error Approach: An Empirical Analysisen_US
dc.title.alternativeEvaluating Top-N Recommendations Using Ranked Error Approach: An Empirical Analysisen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.source.pagenumber30832-30845en_US
dc.source.volume10en_US
dc.source.journalIEEE Accessen_US
dc.identifier.doi10.1109/ACCESS.2022.3159646
dc.identifier.cristin2008525
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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