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Effects of optical activity to Mueller matrix ellipsometry of composed waveplates

dc.contributor.authorVala, Daniel
dc.contributor.authorKoleják, Pierre
dc.contributor.authorPostava, Kamil
dc.contributor.authorKildemo, Morten
dc.contributor.authorProvazníková, Pavlína
dc.contributor.authorPištora, Jaromír
dc.date.accessioned2023-01-23T13:52:34Z
dc.date.available2023-01-23T13:52:34Z
dc.date.created2021-08-24T11:23:51Z
dc.date.issued2021
dc.identifier.citationOptics Express. 2021, 29 (7), 10434-10450.en_US
dc.identifier.issn1094-4087
dc.identifier.urihttps://hdl.handle.net/11250/3045410
dc.language.isoengen_US
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleEffects of optical activity to Mueller matrix ellipsometry of composed waveplatesen_US
dc.title.alternativeEffects of optical activity to Mueller matrix ellipsometry of composed waveplatesen_US
dc.typeJournal articleen_US
dc.typePeer revieweden_US
dc.description.versionpublishedVersionen_US
dc.source.pagenumber10434-10450en_US
dc.source.volume29en_US
dc.source.journalOptics Expressen_US
dc.source.issue7en_US
dc.identifier.doi10.1364/OE.418186
dc.identifier.cristin1928260
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode2


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Navngivelse 4.0 Internasjonal
Except where otherwise noted, this item's license is described as Navngivelse 4.0 Internasjonal