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dc.contributor.authorKhandelwal, Sourabh
dc.contributor.authorChauhan, Yogesh Singh
dc.contributor.authorFjeldly, Tor A
dc.contributor.authorGhosh, Sudip
dc.contributor.authorPampori, Ahtisham
dc.contributor.authorMahajan, Dhawal
dc.contributor.authorDangi, Raghvendra
dc.contributor.authorAhsan, Sheikh Aamir
dc.date.accessioned2020-05-14T13:35:17Z
dc.date.available2020-05-14T13:35:17Z
dc.date.created2019-01-14T16:21:14Z
dc.date.issued2019
dc.identifier.citationIEEE Transactions on Electron Devices. 2019, 66 (1), 80-86.en_US
dc.identifier.issn0018-9383
dc.identifier.urihttps://hdl.handle.net/11250/2654511
dc.description.abstractWe present the latest developments in Advance SPICE Model for GaN (ASM GaN) HEMTs in this paper. The ASM GaN model has been recently selected as an industry-standard compact model for GaN radio frequency (RF)and Power devices. The core Surface potential calculation and the modeling of real Device effects in this model are presented. We discuss the details of the nonlinear access region model and enhancement in this model to include a physical dependence on barrier thickness. We also present the novel model feature of configurable field-plate modeling and discuss the extraction procedure for the same. New results with the ASM GaN model on high-frequency and enhancement-mode GaN Power Devices are also presented.en_US
dc.language.isoengen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.titleASM GaN: Industry Standard Model for GaN RF and Power Devices – Part 1: DC, CV, and RF Modelen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.source.pagenumber80-86en_US
dc.source.volume66en_US
dc.source.journalIEEE Transactions on Electron Devicesen_US
dc.source.issue1en_US
dc.identifier.doi10.1109/TED.2018.2867874
dc.identifier.cristin1656623
dc.description.localcodeThis article will not be available due to copyright restrictions (c) 2019 by IEEEen_US
cristin.unitcode194,63,35,0
cristin.unitnameInstitutt for elektroniske systemer
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode2


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