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dc.contributor.authorXia, Lu
dc.contributor.authorTybell, Thomas
dc.contributor.authorSelbach, Sverre Magnus
dc.date.accessioned2020-04-14T10:41:04Z
dc.date.available2020-04-14T10:41:04Z
dc.date.created2019-08-08T12:09:16Z
dc.date.issued2019
dc.identifier.citationJournal of Materials Chemistry C. 2019, 7 (16), 4870-4878.en_US
dc.identifier.issn2050-7526
dc.identifier.urihttps://hdl.handle.net/11250/2650949
dc.description.abstractPoint defects in BiFeO3 affect both structural and functional properties. To elucidate the role of single Bi vacancies and Bi–O vacancy pairs we investigate their stability and effect on structural and ferroelectric properties in BiFeO3 using first principles density functional theory calculations. Compressive strain is shown to stabilize Bi vacancies, and the Bi vacancy enthalpy of formation drops abruptly at the structural transition from rhombohedral R-phase to tetragonal T-phase. For Bi–O vacancy pairs the situation is more complex, albeit stabilization is found under compressive strain. Out-of-plane oriented vacancy pairs are stabilized in the T-phase, while in-plane oriented vacancy pairs are destabilized compared to the R-phase. It is shown that single Bi vacancies do not affect the spontaneous polarization, while in-plane Bi–O vacancy pairs reduce the in-plane component of the polarization, resulting in a polarization rotation towards [001]. We also discuss the effect of vacancies on the electronic properties of BiFeO3, and show that Bi deficiency is consistent with the experimentally reported p-type conductivity.en_US
dc.language.isoengen_US
dc.publisherRoyal Society of Chemistryen_US
dc.titleBi vacancy formation in BiFeO3 epitaxial thin films under compressive (001)-strain from first principlesen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionacceptedVersionen_US
dc.source.pagenumber4870-4878en_US
dc.source.volume7en_US
dc.source.journalJournal of Materials Chemistry Cen_US
dc.source.issue16en_US
dc.identifier.doi10.1039/c8tc06608f
dc.identifier.cristin1714818
dc.relation.projectNotur/NorStore: NN9264Ken_US
dc.relation.projectNorges forskningsråd: 231430en_US
dc.description.localcode© 2019. This is the authors' accepted and refereed manuscript to the article. The final authenticated version is available online at: https://doi.org/10.1039/C8TC06608Fen_US
cristin.unitcode194,66,35,0
cristin.unitcode194,63,35,0
cristin.unitnameInstitutt for materialteknologi
cristin.unitnameInstitutt for elektroniske systemer
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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