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dc.contributor.authorBradford, Eric
dc.contributor.authorReble, Marcus
dc.contributor.authorImsland, Lars Struen
dc.date.accessioned2020-03-25T14:09:56Z
dc.date.available2020-03-25T14:09:56Z
dc.date.created2020-03-24T02:49:50Z
dc.date.issued2019
dc.identifier.citationEuropean Control Conference (ECC). 2019, 18en_US
dc.identifier.isbn978-3-907144-00-8
dc.identifier.urihttps://hdl.handle.net/11250/2648634
dc.description.abstractNonlinear model predictive control (NMPC) is one of the few methods that can handle multivariate nonlinear control problems while accounting for process constraints. Many dynamic models are however affected by significant stochastic uncertainties that can lead to closed-loop performance problems and infeasibility issues. In this paper we propose a novel stochastic NMPC (SNMPC) algorithm to optimize a probabilistic objective while adhering chance constraints for feasibility in which only noisy measurements are observed at each sampling time. The system predictions are assumed to be both affected by parametric and additive stochastic uncertainties. In particular, we use polynomial chaos expansions (PCE) to expand the random variables of the uncertainties. These are updated using a PCE nonlinear state estimator and exploited in the SNMPC formulation. The SNMPC scheme was verified on a complex polymerization semi-batch reactor case study.en_US
dc.language.isoengen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.ispartof2019 18th European Control Conference (ECC)
dc.subjectKybernetikken_US
dc.subjectCyberneticsen_US
dc.titleOutput feedback stochastic nonlinear model predictive control of a polymerization batch processen_US
dc.typeChapteren_US
dc.typePeer revieweden_US
dc.description.versionacceptedVersionen_US
dc.subject.nsiVDP::Elektrotekniske fag: 540en_US
dc.subject.nsiVDP::Electro-technical sciences: 540en_US
dc.source.pagenumber3144-3151en_US
dc.identifier.doi10.23919/ECC.2019.8795684
dc.identifier.cristin1803108
dc.relation.projectEC/H2020/675215en_US
dc.description.localcode© 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en_US
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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