dc.contributor.author | Schaab, Jakob | |
dc.contributor.author | Shapovalov, Konstantin | |
dc.contributor.author | Schoenherr, Peggy | |
dc.contributor.author | Hackl, Johanna | |
dc.contributor.author | Khan, Muhammad Imtiaz | |
dc.contributor.author | Hentschel, Mario | |
dc.contributor.author | Yan, Zewu | |
dc.contributor.author | Bourret, Edith | |
dc.contributor.author | Schneider, Claus M. | |
dc.contributor.author | Nemsak, Slavomír | |
dc.contributor.author | Stengel, Massimiliano | |
dc.contributor.author | Cano, Andrés | |
dc.contributor.author | Meier, Dennis | |
dc.date.accessioned | 2020-01-14T08:15:43Z | |
dc.date.available | 2020-01-14T08:15:43Z | |
dc.date.created | 2020-01-07T13:48:31Z | |
dc.date.issued | 2019 | |
dc.identifier.citation | Applied Physics Letters. 2019, 115 (12), 122903-1-122803-5. | nb_NO |
dc.identifier.issn | 0003-6951 | |
dc.identifier.uri | http://hdl.handle.net/11250/2636060 | |
dc.description.abstract | Low-temperature X-ray photoemission electron microscopy (X-PEEM) is used to measure the electric potential at domain walls in improper ferroelectric Er0.99Ca0.01MnO3. By combining X-PEEM with scanning probe microscopy and theory, we develop a model that relates the detected X-PEEM contrast to the emergence of uncompensated bound charges, explaining the image formation based on intrinsic electronic domain-wall properties. In contrast to previously applied low-temperature electrostatic force microscopy (EFM), X-PEEM readily distinguishes between positive and negative bound charges at domain walls. Our study introduces an X-PEEM-based approach for low-temperature electrostatic potential mapping, facilitating nanoscale spatial resolution and data acquisition times on the order of 0.1–1 s. | nb_NO |
dc.language.iso | eng | nb_NO |
dc.publisher | AIP Publishing | nb_NO |
dc.title | Electrostatic potential mapping at ferroelectric domain walls by low-temperature photoemission electron microscopy | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.description.version | acceptedVersion | nb_NO |
dc.source.pagenumber | 122903-1-122803-5 | nb_NO |
dc.source.volume | 115 | nb_NO |
dc.source.journal | Applied Physics Letters | nb_NO |
dc.source.issue | 12 | nb_NO |
dc.identifier.doi | 10.1063/1.5117881 | |
dc.identifier.cristin | 1767747 | |
dc.description.localcode | This is the authors’ accepted and refereed manuscript to the article. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared may be found at http://dx.doi.org/10.1063/1.5117881 | nb_NO |
cristin.unitcode | 194,66,35,0 | |
cristin.unitname | Institutt for materialteknologi | |
cristin.ispublished | true | |
cristin.fulltext | postprint | |
cristin.qualitycode | 2 | |