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dc.contributor.advisorVan Helvoort, Antonius Theodorus Johann
dc.contributor.authorMyklebost, Steinar
dc.date.accessioned2017-10-02T14:00:41Z
dc.date.available2017-10-02T14:00:41Z
dc.date.created2017-07-04
dc.date.issued2017
dc.identifierntnudaim:17671
dc.identifier.urihttp://hdl.handle.net/11250/2457800
dc.description.abstractWill be given later
dc.languageeng
dc.publisherNTNU
dc.subjectNanoteknologi, Nanoelektronikk
dc.titleDeveloping Quantitative Image Processing of Scanning Electron Microscopy Data Sets to Evaluate Nanowire Growth
dc.typeMaster thesis


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