Blar i Institutt for materialteknologi på forfatter "Øvrelid, Eivind Johannes"

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    • Development of aluminium alloys with superior properties for additive manufacturing 

      Hanssen, Herman (Master thesis, 2022)
      Selektiv laser smelting og andre pulverbaserte 3D-printing-metoder kan produsere komponenter med høy geometrisk kompleksitet og med suverene fysiske egenskaper. Den høye avkjølingshastigheten fører til en finkornet struktur ...

    • Investigating thermal donors in n-type Cz silicon with carrier density imaging 

      Hu, Yu; Schøn, Hendrik; Øvrelid, Eivind Johannes; Nielsen, Øyvind; Arnberg, Lars (Journal article; Peer reviewed, 2012)
      A new method to map the thermal donor concentration in silicon wafers using carrier density imaging is presented. A map of the thermal donor concentration is extracted with high resolution from free carrier density images ...

    • Investigation of pinholes in Czochralski silicon ingots in relation to structure loss 

      Sortland, Øyvind Sunde; Øvrelid, Eivind Johannes; M'hamdi, Mohammed; Di Sabatino Lundberg, Marisa (Journal article; Peer reviewed, 2019)
      In the production of monocrystalline silicon by the Czochralski process, structure loss frequently reduces yield and increases production time. Structure loss means the transition from monocrystalline to multicrystalline ...

    • Parameter Optimization of Mini 3D Printer for Additive Manufacturing of Hypereutectic Aluminum Silicon Alloys 

      Skar, Harald (Master thesis, 2023)
      Denne oppgaven vil undersøke det stadig voksende feltet med additive produksjonsmetoder (AM) som brukes i produksjonen av komplekse tredimensjonale metallkomponenter. Det har spesielt vært en økning i interessen fra ulike ...

    • Statistical Analysis of Structure Loss in Czochralski Silicon Growth 

      Sortland, Øyvind Sunde; Jomâa, Moez; M'hamdi, Mohammed; Øvrelid, Eivind Johannes; Di Sabatino Lundberg, Marisa (Chapter, 2019)
      In Czochralski monocrystalline silicon growth, structure loss (SL) is the loss of the mono-crystalline structure. It represents a significant loss of productivity. In this work, this phenomenon is investigated by statistical ...

    • Statistical analysis of structure loss in Czochralski silicon growth 

      Sortland, Øyvind Sunde; Jomâa, Moez; M'hamdi, Mohammed; Øvrelid, Eivind Johannes; Di Sabatino Lundberg, Marisa (Journal article; Peer reviewed, 2019)
      In Czochralski monocrystalline silicon growth, structure loss (SL) is the loss of the mono-crystalline structure. It represents a significant loss of productivity. In this work, this phenomenon is investigated by statistical ...